Material characterization
Four Point Probe Setup
A critical tool for material scientists to measure sheet resistance and electrical conductivity without contact resistance errors.
Safety & Construction
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Spring-loaded tungsten carbide probes ensure consistent contact pressure - High-impedance voltmeter integrated for precise voltage drop detection
Technical Specifications
Operational Parameters
- Current Source Adjustable from 100 nA to 100 mA
- Measurement Range 10⁻³ to 10⁵ S/m
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Primary Applications
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Semiconductor Wafer Characterisation
Precise measurement of sheet resistance on semiconductor wafers
Conductive Polymer Resistivity Testing
Resistivity testing for conductive polymers and coatings
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