Material characterization
I-V Characteristic Measurement Setup
The I-V Characteristic Measurement Setup is a precision laboratory instrument designed to analyse the electrical properties of materials, semiconductor devices, and thin films. It provides accurate current-voltage (I-V) sweeps to determine parameters such as conductivity, resistivity, and diode behaviour.
IV-100
IV-200
IV-500
Safety & Construction
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Shielded test chamber to minimize electromagnetic interference (EMI) - Gold-plated probes and high-insulation cabling to ensure low-noise signal path
- Robust aluminium/steel chassis
Technical Specifications
Operational Parameters
- Operational Parameters Current-Voltage (I-V) Profiling, Resistivity Measurement
- Voltage Range ±10V to ±200V (Model Dependent)
- Current Measurement Range 10 pA to 1 A
- Operating Environment Ambient or Controlled Atmosphere (Optional Vacuum Interface)
- Probe Configuration 2-Point or 4-Point Probe Setup
- Controller Integrated Digital Controller with PC Data Logging Interface
- Chamber Material High-grade Aluminum with Anti-static Coating
- Cooling System Passive Cooling (Air)
variants
- IV-100
Basic setup for education and standard material testing.
- IV-200
Sub-nanoampere sensitivity for high-resistance materials.
- IV-500
High-power version for power semiconductor characterisation.
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Primary Applications
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Semiconductor Characterization
Analysing p-n junctions, Schottky barriers, optoelectronic devices, and transistor characteristics (threshold voltage, leakage current).
Materials Science
Studying electrical transport properties of new materials, thin films, and nanomaterials.
Solar Cell Research
Measuring I-V curves under illumination to determine efficiency, fill factor, and open-circuit voltage.
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